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Studia Psychologica Vol.53, No.2, p.123-135, 2011

Title: SAMPLE SIZE NEGLECT PROBLEMS: A CRITICAL ANALYSIS
Author: Stephanie LEM, Wim Van DOOREN, Ellen GILLARD, Lieven VERSCHAFFEL

Abstract: Sample size neglect problems are frequently used in dual process research, but very different accuracy rates are often reported for these problems. This systematic literature review is aimed at identifying factors that possibly underlie these differences. The review points at many task and participant characteristics that (may) account for these different accuracy rates. The implications for studies using sample size neglect problems are discussed, as well as the need for further research to better understand this type of problem and the reasoning processes it evokes.

Keywords: sample size neglect problems, dual process theory, task characteristics
Year: 2011, Volume: 53, Issue: 2 Page From: 123, Page To: 135

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