Home Kovove Materialy-Metallic Materials 2012 Metallic Materials Vol. 50 (2012), no. 5, pp.327-334

Journal info

Select Journal







Webshop Cart

Your Cart is currently empty.

Info: Your browser does not accept cookies. To put products into your cart and purchase them you need to enable cookies.

Metallic Materials Vol. 50 (2012), no. 5, pp.327-334

Title: Influence of technological parameters on evolution of phases in Al-CMA composites prepared by powder metallurgy
Author: I. CERNICKOVA, L. ROŠČÁK, F. ALI, M. KUSÝ, S. SCUDINO, R. ČIČKA, M. DRIENOVSKÝ, P. PRIPUTEN, J. JANOVEC

Abstract: The CMA-powder and the Al-CMA composite (CMA=Al73Mn21Fe6) have been studied with the intention to characterize the influence of selected technological procedures (milling for 80 h, extrusion at 400 °C under 500 MPa, compaction at 550 °C for 0.5 h, and annealing at 550 °C for respective 0.25 and 0.5 h) on the phase evolution inside CMA-areas and at Al/CMA interfaces. In the investigation X-ray diffraction and scanning electron microscopy including energy dispersive X-ray spectroscopy were used. It was shown that CMA-powder consisting of T(HT)+γ2 became totally amorphous after 80 h of milling. During extrusion, compaction, and annealing of the Al-CMA composite, the originally amorphous CMA particles were found to transform into crystalline phases at the assistance of aluminium diffusion towards the CMA-area. At the Al/CMA interfaces on the CMA side, IMC-areas (IMC=intermetallic compound) were formed consisting of Al6(Mn,Fe). T(LT)+Al4 (Mn,Fe)+Al6(Mn,Fe) phases were identified in the CMA-areas after the annealing of the Al-CMA composite for 0.5 h at 550 °C.

Keywords: metal-matrix composites, interfaces, scanning electron microscopy, energy dispersive X-ray spectroscopy, extrusion, annealing
Year: 2012, Volume: 50, Issue: 5 Page From: 327, Page To: 334
doi:10.4149/km_2012_5_327


download file



© AEPress s.r.o
Copyright notice: For any permission to reproduce, archive or otherwise use the documents in the ELiS, please contact AEP.